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Metrics for high-quality specular surfaces

Metrics for high-quality specular surfaces

Baker, Lionel R
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This book supplies the optical component and systems designer, and quality assurance engineers and managers with the definitions, measurement principles, and standard metrics used to characterize high-quality specular surfaces. The author covers both the traditional visual methods as well as newer (but not necessarily better) computer-aided techniques and describes the metrics adopted by the new ISO standards, including the setting of form and finish tolerances. Key issues of industry are raised, to help stimulate research and development of new methods and standards that blend the best of the old and new approaches to surface assessment.
Abstract: This book supplies the optical component and systems designer, and quality assurance engineers and managers with the definitions, measurement principles, and standard metrics used to characterize high-quality specular surfaces.
年:
2004
出版社:
SPIE
语言:
english
页:
151
ISBN 10:
0819455768
ISBN 13:
9780819455765
系列:
SPIE tutorial texts TT65
文件:
PDF, 5.03 MB
IPFS:
CID , CID Blake2b
english, 2004
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