Advanced Characterization Techniques for Thin Film Solar Cells
Daniel Abou-Ras, Thomas Kirchartz, Uwe Rau
The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D.
Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.
年:
2016
出版:
2
出版社:
Wiley-VCH
语言:
english
页:
760
ISBN 10:
3527699031
ISBN 13:
9783527699049
文件:
PDF, 23.40 MB
IPFS:
,
english, 2016
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